Metals & Alloys
Thin and Highly Conductive Copper
This plot shows measurements on copper samples with different thicknesses.
It clearly proves that the system LFA 467 HyperFlash®® can successfully measure samples with very high diffusivities. In addition, by decreasing the sample thickness from 3.0 mm to 0.25 mm, these measurements confirm that even very thin samples can be tested with very high accuracy. Sample preparation and thickness determination have to be carefully considered when measuring thin samples. This is the reason why the uncertainty increases as sample thickness decrease.