热反射法：微纳薄膜与块体材料导热测试兼得 (Thermoreflectance: Thermal Conductivity Determination Solution for both Micro/Nano Scale Films and Bulk Materials)

导热性是指物质传递热量的能力，通常用热导率（）来表示。导热性在材料学、工程技术、能源等领域都有重要应用。宏观尺度下, 热导率是材料的本征特性, 与材料的尺寸无关。然而在微纳尺度下，由于弹道输运（ballistic transport）机制的出现，材料的表观热导率随体系尺寸增大而增大。最终接近块体材料的热导率。因此有时需要分别在微纳尺度和块体尺寸下研究和比较材料导热性能。一般的导热测试方法对样品尺寸都有严格要求，通常无法完全覆盖从宏观到微纳尺度。而NETZSCH的热反射法导热仪（Pico/Nano TR），因使用独有的电路延迟方法（Electrical Delay Method），可以在一台仪器上同时实现对微纳薄膜与块体材料的导热测量。本次webinar将对NETZSCH热反射法导热仪的测试原理进行介绍，并分别通过对微纳薄膜和块体材料的测试案例讲解测试分析方法。 

Thermal transfer properties refers to the ability of a material to transfer heat, typically represented by the thermal conductivity coefficient (k). Thermal conductivity plays a significant role in the fields of materials science, engineering technology, and energy. At the macroscopic scale, thermal conductivity is an intrinsic property of the material, independent of the size of materials. However, at the micro and nano scales, due to the emergence of ballistic transport mechanisms, the effective thermal conductivity of materials increases with the size of the sample, eventually approaching that of bulk materials. Therefore, it is sometimes necessary to study and compare the thermal conductivity of materials at both micro and nano scales and in bulk. Conventional methods of thermal conductivity testing have strict requirements on sample size and usually cannot cover the range from macroscopic to micro and nano scales. However, the ThermoreflectanceThermoreflectance ist eine Methode zur Bestimmung der Temperaturleitfähigkeit und Wärmeleitfähigkeit von Proben mit Dicken im Nano- und Mikrometer-Bereich.thermoreflectance method from NETZSCH (Pico/Nano TR), which uses a unique electrical delay method, enables simultaneous measurement of thermal conductivity of micro and nano thin films and bulk materials on a single instrument. This webinar will introduce the testing principles of the NETZSCH ThermoreflectanceThermoreflectance ist eine Methode zur Bestimmung der Temperaturleitfähigkeit und Wärmeleitfähigkeit von Proben mit Dicken im Nano- und Mikrometer-Bereich.thermoreflectance, and explain the test and analysis methods through testing cases of micro-nano films and bulk materials. 

Speaker:
Dr. Wenxiang Sun
Technical Support Engineer
NETZSCH Scientific Instruments Trading (Shanghai) Co. Ltd.