Simultaneous Thermogravimetry

STA 449 F3 Jupiter®

Fascinating Flexibility in Thermal Analysis 

The simultaneous thermal analyzer NETZSCH STA 449 F3  Jupiter® allows the measurement of mass changes and thermal effects between -150°C and 2400°C.

The high flexibility caused by the various sensors, the great variety of sample crucibles and the wide TGA-measuring range make the system applicable for analysis of all kinds of materials including also inhomogenous substances. Easily interchangeable sample holders allow the optimal system adaption to the diverse application areas (TGA, TGA-DTA and TGA-DSC measurements). Various furnaces, easy interchangeable by the user, cover the complete temperature range (please see accessories).
Through to the vacuum tight design measurements at defined atmospheres (e.g. inert) are possible. The system is controlled by a newly developed integrated digital electronic device. The analysis of measuring data runs under a standard PC and the well-proven Windows® software.

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Technical Data

Temperature range
-150°C to 2400°C
Tungsten furnace 
RT to 2400°C
High-speed furnace
RT to 1250°C

Heating and cooling rates:
0.001 K/min to 50 K/min
(dependent on furnace)

Weighing range:
35000 mg

TG resolution:
0,1 µg (over entire weighing range)

DSC resolution (depending on sensor type):
e.g. < 1 µW for DSC sensor type S and 0.5 µW for DSC sensor type E

inert, oxidizing, reducing, static, dynamic

Switch valve: 
for 2 purge gases and 1 protective gas

Vacuum-tight assembly:
up to 10-4 mbar

FT-IR, MS via Capillary or SKIMMER coupling

This instrument is LabV®️-primed

LabV® takes the data from your analytical instrument: It automatically imports all measurement data into a central and secure database solution, the LabV® software. This allows you to visualize the data in LabV®️ and to make them searchable. Your data will now be accessible from anywhere. Moreover you have the possibility to generate reports.

Application Literature

Product Information

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STA 449 F3  Jupiter® Simultaneous DSC-TGA sample carrier change

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Part 2 Sample Preparation Influencing Factors How to Setup an STA Measurement